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The analytical equipment at the PIMS has been categorized into two areas: X-ray and Electron Diagnostics.


PANalytical Empyrean Series 2 X-ray Diffraction System

Empyrean system is designed as the basic platform for multiple applications in analytical X-ray diffraction field.

The main feature are:

  • High resolution theta-theta goniometer for multi-purpose research (From powder to thin films, from nanomaterials to solid objects).
  • PreFIX concept for optics and stages allows users vary the application of choice in matter of minutes.
  • 2D detector with pixel size 55 um x 55 um, high dynamic range(>1010), cutting-edge photon counting technology.
  • Copper X-ray tube operating on 40 kV with exchangeable of tube focus position.
  • In-situ tensile device built independently.

Xrd contact and appointment : lwang@pims.ac.cn

Electron Diagnostics

FEI Quanta FEG 250 Field Emission Scanning Electron Microscope

The Quanta FEG Scanning Electron Microscope (SEM) produces enlarged images of a variety of specimens, achieving magnifications of over 100 000× providing high resolution imaging in a digital format.

This important and widely used analytical tool provides exceptional depth of view, minimal specimen preparation, and the ability to combine the technique with X-ray microanalysis.

The Quanta line of scanning electron microscopes  are versatile, high-performance instruments with three modes (high vacuum, low vacuum and ESEM) to accommodate the widest range of samples of any scanning electron microscope (SEM) system.

The Quanta SEM systems can be equipped with analytical systems, such as:

  • Energy Dispersive Spectrometer
  • Wavelength Dispersive X-ray Spectroscopy
  • Electron BackScatter Diffraction

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